| ISBN: ISBN: 0-7695-0537-6
|
| ISBN: DOI: 10.1109/DATE.2000.840286
|
| |
| description |
Functional BIST is a promising solution for self-testing complex
digital systems at reduced costs in terms of area and performance
degradation. The present paper addresses the computation of optimal
seeds for an arbitrary sequential module to be used as hardware test
pattern generator. Up to now, only linear feedback shift registers
and accumulator based structures have been used for deterministic
test pattern generation by reseeding. In this paper, a method is
proposed which can be applied to general finite state machines.
Nevertheless the method is absolutely general, for sake of
comparison with previous approaches, in this paper an accumulator
based unit is assumed as pattern generator module. Experiments prove
the effectiveness of the approach which outperforms previous results
for accumulators, in terms of test size and test time, without
sacrifying the fault detection capability.
|
| publisher |
Institute of Electrical and Electronics Engineers
|
| type |
Text
|
| Article in Proceedings
|
| source |
In: Proceedings of the 3rd Conference on Design and Test in Europe
(DATE), Paris, France, March 27-30, 2000, pp. 292-297
|
| contributor |
Rechnerarchitektur (IFI)
|
| subject |
Reliability, Testing, and Fault-Tolerance (CR B.8.1)
|